Pin-Yen TSAI

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor system and operation method thereof
- Patent number 12,032,891
- Issue date Jul 9, 2024
- United Microelectronics Corp.
- Pin-Yen Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image test system, test assembly and image capture card
- Patent number 11,693,042
- Issue date Jul 4, 2023
- KING YUAN ELECTRONICS CO, LTD.
- Pin-Yan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Image test system and test assembly thereof
- Patent number 11,300,611
- Issue date Apr 12, 2022
- KING YUAN ELECTRONICS CO, LTD.
- Pin-Yan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Mask weak pattern recognition apparatus and mask weak pattern recog...
- Patent number 10,762,618
- Issue date Sep 1, 2020
- United Microelectronics Corp.
- Pin-Yen Tsai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR ESTABLISHING WEAK PATTERN SEVERITY MODEL
- Publication number 20240256911
- Publication date Aug 1, 2024
- United Microelectronics Corp.
- Yan-Hsiu LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULE FOR PREDICTING SEMICONDUCTOR PHYSICAL DEFECTS AND METHOD THE...
- Publication number 20240241498
- Publication date Jul 18, 2024
- United Microelectronics Corp.
- Pin-Yen TSAI
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor system and operation method thereof
- Publication number 20230195989
- Publication date Jun 22, 2023
- UNITED MICROELECTRONICS CORP.
- Pin-Yen Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD
- Publication number 20220155361
- Publication date May 19, 2022
- King Yuan Electronics Co., Ltd.
- Pin-Yan TSAI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE TEST SYSTEM AND TEST ASSEMBLY THEREOF
- Publication number 20210132146
- Publication date May 6, 2021
- King Yuan Electronics Co., Ltd.
- Pin-Yan TSAI
- G01 - MEASURING TESTING
Information Patent Application
MASK WEAK PATTERN RECOGNITION APPARATUS AND MASK WEAK PATTERN RECOG...
- Publication number 20200265573
- Publication date Aug 20, 2020
- United Microelectronics Corp.
- Pin-Yen TSAI
- G06 - COMPUTING CALCULATING COUNTING