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Ping-Chin Yeh
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Runtime measurement of process variations and supply voltage charac...
Patent number
11,585,854
Issue date
Feb 21, 2023
Xilinx, Inc.
Da Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
IC die with dummy structures
Patent number
11,114,344
Issue date
Sep 7, 2021
Xilinx, Inc.
Hui-Wen Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Implantation for etch stop liner
Patent number
11,107,696
Issue date
Aug 31, 2021
Xilinx, Inc.
Li-Wen Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-die transistor characterization in an IC
Patent number
10,379,155
Issue date
Aug 13, 2019
Xilinx, Inc.
Ping-Chin Yeh
G01 - MEASURING TESTING
Information
Patent Grant
Method and design of low sheet resistance MEOL resistors
Patent number
10,103,139
Issue date
Oct 16, 2018
Xilinx, Inc.
Nui Chong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit with stress inserts
Patent number
8,350,253
Issue date
Jan 8, 2013
Xilinx, Inc.
Bei Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method for making the same
Patent number
8,329,568
Issue date
Dec 11, 2012
Xilinx, Inc.
Jae-Gyung Ahn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and structure for controlling floating body effects
Patent number
7,211,473
Issue date
May 1, 2007
Advanced Micro Devices, Inc.
Mario M. Pelella
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Doped spacer liner for improved transistor performance
Patent number
6,583,016
Issue date
Jun 24, 2003
Advanced Micro Devices, Inc.
Andy C. Wei
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DESIGN OF LOW SHEET RESISTANCE MEOL RESISTORS
Publication number
20170012041
Publication date
Jan 12, 2017
Xilinx, Inc.
Nui Chong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-DIE TRANSISTOR CHARACTERIZATION IN AN IC
Publication number
20160097805
Publication date
Apr 7, 2016
Xilinx, Inc.
Ping-Chin Yeh
G01 - MEASURING TESTING