Ping He

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 11,885,738
- Issue date Jan 30, 2024
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,675,208
- Issue date Jun 13, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,989,601
- Issue date Apr 27, 2021
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 10,859,439
- Issue date Dec 8, 2020
- J. A. Woollam Co., Inc.
- Martin M. Lihardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for producing a more uniform intensity waveleng...
- Patent number 10,627,288
- Issue date Apr 21, 2020
- J. A. Woollam Co., Inc.
- Martin M Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for producing a more uniform intensity waveleng...
- Patent number 10,612,976
- Issue date Apr 7, 2020
- J.A. Woollan Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflecting optics with enhanced detector system
- Patent number 10,338,362
- Issue date Jul 2, 2019
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Enhanced detector operation made possible by application of a funct...
- Patent number 10,247,611
- Issue date Apr 2, 2019
- J.A. Wooliam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Information maintenance, intensity attenuation, and angle/plane of...
- Patent number 10,066,989
- Issue date Sep 4, 2018
- J. A. Woollam Co., Inc.
- Martin M Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Deviation angle self-compensating substantially achromatic retarder
- Patent number 10,061,068
- Issue date Aug 28, 2018
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G02 - OPTICS
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,018,815
- Issue date Jul 10, 2018
- J.A. Woolam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Elliposometer system with polarization state generator and polariza...
- Patent number 9,933,357
- Issue date Apr 3, 2018
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and beam collecting optics with wavelength dependent...
- Patent number 9,921,395
- Issue date Mar 20, 2018
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Beam focusing and beam collecting optics
- Patent number 9,500,843
- Issue date Nov 22, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Reflective focusing optics
- Patent number 9,442,016
- Issue date Sep 13, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
View-finder in ellipsometer or the like systems
- Patent number 8,587,781
- Issue date Nov 19, 2013
- J. A. Woollam Co., Inc.
- Martin M Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric investigation and analysis of textured samples
- Patent number 8,570,513
- Issue date Oct 29, 2013
- J. A. Woollam Co., Inc.
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometers and polarimeters comprising polarization state compen...
- Patent number 8,467,057
- Issue date Jun 18, 2013
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Mounting for deviation angle self compensating substantially achrom...
- Patent number 8,462,341
- Issue date Jun 11, 2013
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 8,436,994
- Issue date May 7, 2013
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
View-finder in ellipsometer or the like systems
- Patent number 8,339,602
- Issue date Dec 25, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
Information Patent Grant
System and method of applying horizontally oriented arc-lamps in el...
- Patent number 8,189,193
- Issue date May 29, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric investigation and analysis of textured samples
- Patent number 8,059,276
- Issue date Nov 15, 2011
- J. A. Woollam Co., Inc.
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter in sample investigation system
- Patent number 8,013,996
- Issue date Sep 6, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 7,872,751
- Issue date Jan 18, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System and method of applying horizontally oriented arc-lamps in el...
- Patent number 7,738,105
- Issue date Jun 15, 2010
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Information maintenance during intensity attenuation in focused beams
- Patent number 7,671,989
- Issue date Mar 2, 2010
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Publication number 20220244169
- Publication date Aug 4, 2022
- J. A. WOOLLAM CO., INC.
- Ping He
- G02 - OPTICS
Information Patent Application
BEAM FOCUSING AND BEAM COLLECTING OPTICS
- Publication number 20160356998
- Publication date Dec 8, 2016
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Reflective focusing optics
- Publication number 20150355029
- Publication date Dec 10, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Publication number 20140204203
- Publication date Jul 24, 2014
- J. A. WOOLLAM CO., INC.
- Martin M. Lihardt
- G02 - OPTICS
Information Patent Application
View-finder in ellipsometer or the like systems
- Publication number 20120314218
- Publication date Dec 13, 2012
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Ellipsometric investigation and analysis of textured samples
- Publication number 20120057158
- Publication date Mar 8, 2012
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Application
Mounting for deviation angle self compensating substantially achrom...
- Publication number 20110188040
- Publication date Aug 4, 2011
- Ping He
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20110109906
- Publication date May 12, 2011
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20090103093
- Publication date Apr 23, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Ellipsometric investigation and analysis of textured samples
- Publication number 20090103094
- Publication date Apr 23, 2009
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Application
Information maintenance during intensity attenuation in focused beams
- Publication number 20080285035
- Publication date Nov 20, 2008
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Combined spatial filter and relay systems
- Publication number 20060268271
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Spatial filter source beam conditioning in ellipsometer and the lik...
- Publication number 20010046089
- Publication date Nov 29, 2001
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System and method of improving electromagnetic radiation beam chara...
- Publication number 20010033377
- Publication date Oct 25, 2001
- James D. Welch
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Beam focusing and reflective optics

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Systems and methods for producing a more uniform intensity waveleng...

Systems and methods for producing a more uniform intensity waveleng...

Beam focusing and reflecting optics with enhanced detector system

Enhanced detector operation made possible by application of a funct...

Information maintenance, intensity attenuation, and angle/plane of...

Deviation angle self-compensating substantially achromatic retarder

Beam focusing and reflective optics

Elliposometer system with polarization state generator and polariza...

Beam focusing and beam collecting optics with wavelength dependent...

Beam focusing and beam collecting optics

Reflective focusing optics

View-finder in ellipsometer or the like systems

Ellipsometric investigation and analysis of textured samples

Ellipsometers and polarimeters comprising polarization state compen...

Mounting for deviation angle self compensating substantially achrom...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

View-finder in ellipsometer or the like systems

System and method of applying horizontally oriented arc-lamps in el...

Sample investigating system and method of use

Ellipsometric investigation and analysis of textured samples

Spatial filter in sample investigation system

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

System and method of applying horizontally oriented arc-lamps in el...

Information maintenance during intensity attenuation in focused beams

Patents Applicationslast 30 patents

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

BEAM FOCUSING AND BEAM COLLECTING OPTICS

Reflective focusing optics

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

View-finder in ellipsometer or the like systems

Ellipsometric investigation and analysis of textured samples

Mounting for deviation angle self compensating substantially achrom...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Ellipsometric investigation and analysis of textured samples

Information maintenance during intensity attenuation in focused beams

System for and method of investigating the exact same point on a sa...

Combined spatial filter and relay systems in rotating compensator e...

Combined spatial filter and relay systems

Spatial filter source beam conditioning in ellipsometer and the lik...

System and method of improving electromagnetic radiation beam chara...