PING HSUN SU

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having test structure
- Patent number 9,337,112
- Issue date May 10, 2016
- Samsung Electronics Co., Ltd.
- Ping Hsun Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having test structure
- Patent number 9,082,739
- Issue date Jul 14, 2015
- Samsung Electronics Co., Ltd.
- Ping Hsun Su
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE
- Publication number 20160020159
- Publication date Jan 21, 2016
- Samsung Electronics Co., Ltd.
- PING HSUN SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEST STRUCTURE
- Publication number 20140339559
- Publication date Nov 20, 2014
- Samsung Electronics Co., Ltd.
- PING HSUN SU
- H01 - BASIC ELECTRIC ELEMENTS