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Patent Grant
XY platform device with nanoscale precision
Patent number
7,295,495
Issue date
Nov 13, 2007
National Taipei University of Technology
Ping-Lang Yen
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
XY platform device with nanoscale precision
Publication number
20050121597
Publication date
Jun 9, 2005
National Taipei University of Technology
Ping-Lang Yen
G01 - MEASURING TESTING