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Patents Grantslast 30 patents

Information Patent Grant
Measurement tool and method for lithography masks
- Patent number 12,032,298
- Issue date Jul 9, 2024
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Variable optical attenuator multiplexer with a thermal isolating op...
- Patent number 7,356,210
- Issue date Apr 8, 2008
- Intel Corporation
- William Wong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT TOOL AND METHOD FOR LITHOGRAPHY MASKS
- Publication number 20220011679
- Publication date Jan 13, 2022
- Intel Corporation
- Yoshihiro TEZUKA
- G01 - MEASURING TESTING
Information Patent Application
Variable optical attenuator multiplexer with a thermal isolating op...
- Publication number 20050286897
- Publication date Dec 29, 2005
- Intel Corporation
- William Wong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Measuring coupling characteristics of optical devices
- Publication number 20040264842
- Publication date Dec 30, 2004
- Tsung-Ein Tsai
- G02 - OPTICS