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Suzhou, CN
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last 30 patents
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Patent Grant
Integrated circuit with secure scan enable
Patent number
9,927,490
Issue date
Mar 27, 2018
NXP USA, INC.
Pingli Hao
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
INTEGRATED CIRCUIT WITH SECURE SCAN ENABLE
Publication number
20170089978
Publication date
Mar 30, 2017
FREESCALE SEMICONDUCTOR, INC.
PINGLI HAO
G01 - MEASURING TESTING