Piotr Edelman

Follow

Person

Tampa, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-contact method for acquiring charge-voltage data on miniature t...
- Patent number 7,202,691
- Issue date Apr 10, 2007
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for elevated temperature measurement with probes...
- Patent number 6,771,091
- Issue date Aug 3, 2004
- Semiconductor Diagnostics, Inc.
- Jacek J. Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the interface trap charge in an oxide semiconductor...
- Patent number 6,037,797
- Issue date Mar 14, 2000
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the mobile ion concentration in the oxide layer of a...
- Patent number 5,773,989
- Issue date Jun 30, 1998
- University of South Florida
- Piotr Edelman
- G01 - MEASURING TESTING
Information Patent Grant
Determining long minority carrier diffusion lengths
- Patent number 5,663,657
- Issue date Sep 2, 1997
- University of South Florida
- Jacek Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charge Metrology for Integrated Measurement
- Publication number 20180315630
- Publication date Nov 1, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-contact method for acquiring charge-voltage data on miniature t...
- Publication number 20060267622
- Publication date Nov 30, 2006
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Method and system for elevated temperature measurement with probes...
- Publication number 20040057497
- Publication date Mar 25, 2004
- Jacek J. Lagowski
- G01 - MEASURING TESTING