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Piotr Grabiec
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Warszawa, PL
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoprobe tip for advanced scanning probe microscopy comprising a l...
Patent number
8,056,402
Issue date
Nov 15, 2011
Advanced Micro Devices, Inc.
Michael Hecker
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Monolithic active pixel dosimeter
Patent number
7,582,875
Issue date
Sep 1, 2009
Universitaet Karlsruhe.
Massimo Caccia
G01 - MEASURING TESTING
Information
Patent Grant
Electronic circuit for ion sensor with body effect reduction
Patent number
7,368,917
Issue date
May 6, 2008
Chung-Yuan Christian University
Wen-Yaw Chung
G01 - MEASURING TESTING
Information
Patent Grant
Field effect transistor sensor
Patent number
7,335,942
Issue date
Feb 26, 2008
Universitaet Kassel
Klaus Edinger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NANOPROBE TIP FOR ADVANCED SCANNING PROBE MICROSCOPY COMPRISING A L...
Publication number
20090114000
Publication date
May 7, 2009
Michael Hecker
G01 - MEASURING TESTING
Information
Patent Application
Electronic circuit for ion sensor with body effect reduction
Publication number
20070089988
Publication date
Apr 26, 2007
Wen-Yaw Chung
G01 - MEASURING TESTING
Information
Patent Application
Monolithic active pixel dosimeter
Publication number
20060043313
Publication date
Mar 2, 2006
Universitaet Karlsruhe
Massimo Caccia
G01 - MEASURING TESTING
Information
Patent Application
Field effect transistor sensor
Publication number
20050062116
Publication date
Mar 24, 2005
Klaus Edinger
G01 - MEASURING TESTING