Pleun Dona

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Vacuum compatible X-ray shield
- Patent number 11,972,920
- Issue date Apr 30, 2024
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of thermal magnetic field noise in TEM corrector systems
- Patent number 11,915,904
- Issue date Feb 27, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial alignment assembly, and charged particle microscope comprisin...
- Patent number 11,773,905
- Issue date Oct 3, 2023
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of thermal magnetic field noise in TEM corrector systems
- Patent number 11,437,216
- Issue date Sep 6, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a charged particle detector
- Patent number 11,417,498
- Issue date Aug 16, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coating on dielectric insert of a resonant RF cavity
- Patent number 11,328,892
- Issue date May 10, 2022
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi modal cryo compatible GUID grid
- Patent number 11,101,104
- Issue date Aug 24, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser-based phase plate image contrast manipulation
- Patent number 11,101,101
- Issue date Aug 24, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for preparing sample for cryogenic electron mic...
- Patent number 10,921,268
- Issue date Feb 16, 2021
- FEI Company
- Bas Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder assembly for cooperating with a nanoreactor and an electron...
- Patent number 9,812,285
- Issue date Nov 7, 2017
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-chamber for inspecting sample material
- Patent number 9,741,529
- Issue date Aug 22, 2017
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder assembly for cooperating with an environmental cell and an e...
- Patent number 9,524,850
- Issue date Dec 20, 2016
- FEI Company
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-reactor for observing particles in a fluid
- Patent number 9,162,211
- Issue date Oct 20, 2015
- FEI Company
- Gerard Anne Nicolaas Van Veen
- G01 - MEASURING TESTING
Information Patent Grant
Mounting structures for multi-detector electron microscopes
- Patent number 8,993,963
- Issue date Mar 31, 2015
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
- Patent number 8,757,873
- Issue date Jun 24, 2014
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,592,764
- Issue date Nov 26, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,410,439
- Issue date Apr 2, 2013
- PEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Sample carrier
- Patent number D657474
- Issue date Apr 10, 2012
- FEI Company
- Pleun Dona
- D24 - Medical and laboratory equipment
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,080,791
- Issue date Dec 20, 2011
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Sample carrier comprising a deformable strip of material folded bac...
- Patent number 8,011,259
- Issue date Sep 6, 2011
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle optical system with dual loading options
- Patent number 7,989,778
- Issue date Aug 2, 2011
- FEI Company
- Johannes Antonius Maria Van Den Oetelaar
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Transfer mechanism for transferring a specimen
- Patent number 7,888,655
- Issue date Feb 15, 2011
- FEI Company
- Erik Pieter van Gaasbeek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for coupling and disconnecting a co-operative composite stru...
- Patent number 7,767,979
- Issue date Aug 3, 2010
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...
- Publication number 20240203685
- Publication date Jun 20, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser Thermal Epitaxy in a Charged Particle Microscope
- Publication number 20240161999
- Publication date May 16, 2024
- FEI Company
- Rudolf Geurink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
- Publication number 20230207254
- Publication date Jun 29, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM COMPATIBLE X-RAY SHIELD
- Publication number 20230162942
- Publication date May 25, 2023
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS
- Publication number 20220392736
- Publication date Dec 8, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS
- Publication number 20220208507
- Publication date Jun 30, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL ALIGNMENT ASSEMBLY, AND CHARGED PARTICLE MICROSCOPE COMPRISIN...
- Publication number 20210366684
- Publication date Nov 25, 2021
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MIC...
- Publication number 20210072170
- Publication date Mar 11, 2021
- FEI Company
- Bas HENDRIKSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI MODAL CRYO COMPATIBLE GUID GRID
- Publication number 20210066032
- Publication date Mar 4, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COATING ON DIELECTRIC INSERT OF A RESONANT RF CAVITY
- Publication number 20210043410
- Publication date Feb 11, 2021
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A CHARGED PARTICLE DETECTOR
- Publication number 20210020400
- Publication date Jan 21, 2021
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER-BASED PHASE PLATE IMAGE CONTRAST MANIPULATION
- Publication number 20200365366
- Publication date Nov 19, 2020
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
- Publication number 20200013580
- Publication date Jan 9, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS
Information Patent Application
HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON...
- Publication number 20170213691
- Publication date Jul 27, 2017
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL
- Publication number 20170032928
- Publication date Feb 2, 2017
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SOURCE GIS FOR PARTICLE-OPTICAL APPARATUS
- Publication number 20160244871
- Publication date Aug 25, 2016
- FEI Company
- Johannes Jacobus Lambertus Mulders
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Mounting structures for multi-detector electron microscopes
- Publication number 20140319347
- Publication date Oct 30, 2014
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20140077080
- Publication date Mar 20, 2014
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
- Publication number 20130240731
- Publication date Sep 19, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
Holder Assembly for Cooperating with an Environmental Cell and an E...
- Publication number 20130213439
- Publication date Aug 22, 2013
- DELFT UNIVERSITY OF TECHNOLOGY
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring the Temperature of a Sample Carrier in a Charge...
- Publication number 20120128028
- Publication date May 24, 2012
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20120074333
- Publication date Mar 29, 2012
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID
- Publication number 20110097706
- Publication date Apr 28, 2011
- FEI Company
- Gerard Anne Nicolaas van Veen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE CARRIER FOR SAMPLE HOLDER
- Publication number 20100230609
- Publication date Sep 16, 2010
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
- Publication number 20100148064
- Publication date Jun 17, 2010
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS
- Publication number 20100108907
- Publication date May 6, 2010
- FEI Company
- JOHANNES ANTONIUS MARIA VEN DEN OETELAAR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transfer mechanism for transferring a specimen
- Publication number 20080283768
- Publication date Nov 20, 2008
- FEI Company
- Erik Pieter van Gaasbeek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample carrier and sample holder
- Publication number 20080250881
- Publication date Oct 16, 2008
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Vacuum compatible X-ray shield

Reduction of thermal magnetic field noise in TEM corrector systems

Axial alignment assembly, and charged particle microscope comprisin...

Reduction of thermal magnetic field noise in TEM corrector systems

Method of manufacturing a charged particle detector

Coating on dielectric insert of a resonant RF cavity

Multi modal cryo compatible GUID grid

Laser-based phase plate image contrast manipulation

Methods and devices for preparing sample for cryogenic electron mic...

Gun lens design in a charged particle microscope

Holder assembly for cooperating with a nanoreactor and an electron...

Micro-chamber for inspecting sample material

Holder assembly for cooperating with an environmental cell and an e...

Micro-reactor for observing particles in a fluid

Mounting structures for multi-detector electron microscopes

Method of measuring the temperature of a sample carrier in a charge...

X-ray detector for electron microscope

X-ray detector for electron microscope

Sample carrier

X-ray detector for electron microscope

Sample carrier comprising a deformable strip of material folded bac...

Charged-particle optical system with dual loading options

Transfer mechanism for transferring a specimen

Method for coupling and disconnecting a co-operative composite stru...

Patents Applicationslast 30 patents

POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...

Laser Thermal Epitaxy in a Charged Particle Microscope

ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION

VACUUM COMPATIBLE X-RAY SHIELD

REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS

REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS

AXIAL ALIGNMENT ASSEMBLY, AND CHARGED PARTICLE MICROSCOPE COMPRISIN...

METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MIC...

MULTI MODAL CRYO COMPATIBLE GUID GRID

COATING ON DIELECTRIC INSERT OF A RESONANT RF CAVITY

METHOD OF MANUFACTURING A CHARGED PARTICLE DETECTOR

LASER-BASED PHASE PLATE IMAGE CONTRAST MANIPULATION

ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON...

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

MULTI-SOURCE GIS FOR PARTICLE-OPTICAL APPARATUS

Mounting structures for multi-detector electron microscopes

X-ray Detector for Electron Microscope

X-RAY DETECTOR FOR ELECTRON MICROSCOPE

Holder Assembly for Cooperating with an Environmental Cell and an E...

Method of Measuring the Temperature of a Sample Carrier in a Charge...

X-ray Detector for Electron Microscope

MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID

SAMPLE CARRIER FOR SAMPLE HOLDER

X-RAY DETECTOR FOR ELECTRON MICROSCOPE

CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS

Transfer mechanism for transferring a specimen

Sample carrier and sample holder