Po-Ching HE

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Hsinchu City, TW

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Patents Applicationslast 30 patents

Information Patent Application
X-RAY MEASUREMENT SYSTEM WITH HIGH SIGNAL RESOLUTION
- Publication number 20250147195
- Publication date May 8, 2025
- NanoSeex Inc.
- YU-YAN AU YONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS