Po-Wei Tsou

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Taoyuan City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Testkey and testing system which reduce leakage current
- Patent number 11,614,486
- Issue date Mar 28, 2023
- United Microelectronics Corp.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for testing a device-under-test by using a voltage-set...
- Patent number 9,939,463
- Issue date Apr 10, 2018
- United Microelectronics Corp.
- Po-Wei Tsou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTKEY AND TESTING SYSTEM WHICH REDUCE LEAKAGE CURRENT
- Publication number 20230020783
- Publication date Jan 19, 2023
- UNITED MICROELECTRONICS CORP.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR TESTING A DEVICE-UNDER-TEST BY USING A VOLTAGE-SET...
- Publication number 20170292976
- Publication date Oct 12, 2017
- UNITED MICROELECTRONICS CORP.
- Po-Wei Tsou
- G01 - MEASURING TESTING