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Pradeep PERIASAMY
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Bangalore, IN
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last 30 patents
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Patent Grant
Decoded register outputs enabling test clock to selected asynchrono...
Patent number
8,479,068
Issue date
Jul 2, 2013
Texas Instruments Incorporated
Pradeep Periasamy
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM, CIRCUIT, AND DEVICE FOR ASYNCHRONOUSLY SCAN CAPTURING MULTI...
Publication number
20110276849
Publication date
Nov 10, 2011
Pradeep PERIASAMY
G01 - MEASURING TESTING