Prakash Periasamy

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,900,923
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,545,110
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,545,111
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Substrate structure with spatial arrangement configured for couplin...
- Patent number 10,510,675
- Issue date Dec 17, 2019
- GLOBALFOUNDRIES Inc.
- Somnath Ghosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,324,056
- Issue date Jun 18, 2019
- International Business Machines Corporation
- Fen Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,309,919
- Issue date Jun 4, 2019
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Moisture detection and ingression monitoring systems and methods of...
- Patent number 10,126,260
- Issue date Nov 13, 2018
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide structures used in phonotics chip packaging
- Patent number 10,078,183
- Issue date Sep 18, 2018
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Grant
Electromigration testing of interconnect analogues having bottom-co...
- Patent number 9,851,397
- Issue date Dec 26, 2017
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Void monitoring device for measurement of wafer temperature variations
- Patent number 9,543,219
- Issue date Jan 10, 2017
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20200049651
- Publication date Feb 13, 2020
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20190250116
- Publication date Aug 15, 2019
- International Business Machines Corporation
- Fen CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUBSTRATE STRUCTURE WITH SPATIAL ARRANGEMENT CONFIGURED FOR COUPLIN...
- Publication number 20190244911
- Publication date Aug 8, 2019
- GLOBALFOUNDRIES INC.
- Somnath Ghosh
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20180356359
- Publication date Dec 13, 2018
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...
- Publication number 20180356358
- Publication date Dec 13, 2018
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE STRUCTURES
- Publication number 20170168242
- Publication date Jun 15, 2017
- GLOBALFOUNDRIES INC.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Application
MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS
- Publication number 20160327502
- Publication date Nov 10, 2016
- International Business Machines Corporation
- Fen CHEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...
- Publication number 20160258998
- Publication date Sep 8, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
VOID MONITORING DEVICE FOR MEASUREMENT OF WAFER TEMPERATURE VARIATIONS
- Publication number 20160155675
- Publication date Jun 2, 2016
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING

Prakash Periasamy

Person

Patents Grantslast 30 patents

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Substrate structure with spatial arrangement configured for couplin...

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Moisture detection and ingression monitoring systems and methods of...

Waveguide structures used in phonotics chip packaging

Electromigration testing of interconnect analogues having bottom-co...

Void monitoring device for measurement of wafer temperature variations

Patents Applicationslast 30 patents

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

SUBSTRATE STRUCTURE WITH SPATIAL ARRANGEMENT CONFIGURED FOR COUPLIN...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS AND METHODS OF...

WAVEGUIDE STRUCTURES

MOISTURE DETECTION AND INGRESSION MONITORING SYSTEMS

ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...

VOID MONITORING DEVICE FOR MEASUREMENT OF WAFER TEMPERATURE VARIATIONS