Prasad Naidu

Person

Bangalore, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-level temperature detection with offset-free input sampling
- Patent number 10,670,471
- Issue date Jun 2, 2020
- SanDisk Technologies LLC
- Prasad Naidu
- G01 - MEASURING TESTING
Information Patent Grant
On-die measurement technique for I/O DC parameters VOL and VOH
- Patent number 9,945,888
- Issue date Apr 17, 2018
- SanDisk Technologies LLC
- Prasad Naidu
- G01 - MEASURING TESTING
Information Patent Grant
Supply noise current control circuit in bypass mode
- Patent number 9,098,101
- Issue date Aug 4, 2015
- SanDisk Technologies Inc.
- Prasad Naidu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-calibrating relaxation oscillator based clock cycle
- Patent number 8,669,817
- Issue date Mar 11, 2014
- SanDisk Technologies Inc.
- Deepak Pancholi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Controlled load regulation and improved response time of LDO with a...
- Patent number 8,471,538
- Issue date Jun 25, 2013
- SanDisk Technologies Inc.
- Deepak Pancholi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-calibrating relaxation oscillator based clock source
- Patent number 8,085,099
- Issue date Dec 27, 2011
- SanDisk Technologies Inc.
- Deepak Pancholi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MULTI-LEVEL TEMPERATURE DETECTION WITH OFFSET-FREE INPUT SAMPLING
- Publication number 20180120166
- Publication date May 3, 2018
- SanDisk Technologies LLC
- Prasad Naidu
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE MEASUREMENT TECHNIQUE FOR I/O DC PARAMETERS VOL AND VOH
- Publication number 20170160317
- Publication date Jun 8, 2017
- SANDISK TECHNOLOGIES INC.
- Prasad Naidu
- G01 - MEASURING TESTING
Information Patent Application
PROCESS DETECTION CIRCUIT
- Publication number 20140266290
- Publication date Sep 18, 2014
- Bhavin Odedara
- G01 - MEASURING TESTING
Information Patent Application
SUPPLY NOISE CURRENT CONTROL CIRCUIT IN BYPASS MODE
- Publication number 20140103890
- Publication date Apr 17, 2014
- Prasad Naidu
- G05 - CONTROLLING REGULATING
Information Patent Application
Self-Calibrating Relaxation Oscillator Based Clock Cycle
- Publication number 20120062326
- Publication date Mar 15, 2012
- Deepak Pancholi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Self-Calibrating Relaxation Oscillator Based Clock Source
- Publication number 20110241784
- Publication date Oct 6, 2011
- Deepak Pancholi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Controlled Load Regulation and Improved Response Time of LDO with A...
- Publication number 20110181257
- Publication date Jul 28, 2011
- Deepak Pancholi
- G05 - CONTROLLING REGULATING
Information Patent Application
Partial Feedback Mechanism in Voltage Regulators to Reduce Output N...
- Publication number 20110133710
- Publication date Jun 9, 2011
- Deepak Pancholi
- G05 - CONTROLLING REGULATING

Prasad Naidu

Person

Patents Grantslast 30 patents

Multi-level temperature detection with offset-free input sampling

On-die measurement technique for I/O DC parameters VOL and VOH

Supply noise current control circuit in bypass mode

Self-calibrating relaxation oscillator based clock cycle

Controlled load regulation and improved response time of LDO with a...

Self-calibrating relaxation oscillator based clock source

Patents Applicationslast 30 patents

MULTI-LEVEL TEMPERATURE DETECTION WITH OFFSET-FREE INPUT SAMPLING

ON-DIE MEASUREMENT TECHNIQUE FOR I/O DC PARAMETERS VOL AND VOH

PROCESS DETECTION CIRCUIT

SUPPLY NOISE CURRENT CONTROL CIRCUIT IN BYPASS MODE

Self-Calibrating Relaxation Oscillator Based Clock Cycle

Self-Calibrating Relaxation Oscillator Based Clock Source

Controlled Load Regulation and Improved Response Time of LDO with A...

Partial Feedback Mechanism in Voltage Regulators to Reduce Output N...