Prasanth V

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan-based MCM interconnect testing
- Patent number 9,797,948
- Issue date Oct 24, 2017
- Texas Instruments Incorporated
- Milan Shetty
- G01 - MEASURING TESTING
Information Patent Grant
Scan-based MCM interconnecting testing
- Patent number 9,140,754
- Issue date Sep 22, 2015
- Texas Instruments Incorporated
- Milan Shetty
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN-BASED MCM INTERCONNECT TESTING
- Publication number 20150355278
- Publication date Dec 10, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Milan Shetty
- G01 - MEASURING TESTING
Information Patent Application
SCAN-BASED MCM INTERCONNECTING TESTING
- Publication number 20120221906
- Publication date Aug 30, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Milan SHETTY
- G01 - MEASURING TESTING