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Prasanth V
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Bangalore, IN
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Patents Grants
last 30 patents
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Patent Grant
Scan-based MCM interconnect testing
Patent number
9,797,948
Issue date
Oct 24, 2017
Texas Instruments Incorporated
Milan Shetty
G01 - MEASURING TESTING
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Patent Grant
Scan-based MCM interconnecting testing
Patent number
9,140,754
Issue date
Sep 22, 2015
Texas Instruments Incorporated
Milan Shetty
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SCAN-BASED MCM INTERCONNECT TESTING
Publication number
20150355278
Publication date
Dec 10, 2015
TEXAS INSTRUMENTS INCORPORATED
Milan Shetty
G01 - MEASURING TESTING
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Patent Application
SCAN-BASED MCM INTERCONNECTING TESTING
Publication number
20120221906
Publication date
Aug 30, 2012
TEXAS INSTRUMENTS INCORPORATED
Milan SHETTY
G01 - MEASURING TESTING