Membership
Tour
Register
Log in
Prashant A. Aji
Follow
Person
San Jose, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Autonomous substrate processing system
Patent number
11,709,477
Issue date
Jul 25, 2023
Applied Materials, Inc.
Priyadarshi Panda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for enhancing inspection sensitivity of an insp...
Patent number
9,747,520
Issue date
Aug 29, 2017
KLA-Tencor Corporation
Shifang Li
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
Patent number
9,645,097
Issue date
May 9, 2017
KLA-Tencor Corporation
Lena Nicolaides
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and systems for measuring a characteristic of a substrate o...
Patent number
8,765,496
Issue date
Jul 1, 2014
KLA-Tencor Technologies Corp.
Mehran Nasser-Ghodsi
G01 - MEASURING TESTING
Information
Patent Grant
Optical defect amplification for improved sensitivity on patterned...
Patent number
8,705,027
Issue date
Apr 22, 2014
KLA-Tencor Corporation
Steven R. Lange
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for searching through and analyzing defect im...
Patent number
7,283,659
Issue date
Oct 16, 2007
KLA-Tencor Technologies Corporation
David R. Bakker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system setup techniques
Patent number
7,072,786
Issue date
Jul 4, 2006
KLA-Tencor Technologies, Corporation
David Bruce Coldren
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Inspection system setup techniques
Patent number
6,959,251
Issue date
Oct 25, 2005
KLA-Tencor Technologies, Corporation
David Bruce Coldren
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Patents Applications
last 30 patents
Information
Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
Publication number
20230305531
Publication date
Sep 28, 2023
Applied Materials, Inc.
Priyadarshi Panda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
Publication number
20220214662
Publication date
Jul 7, 2022
Applied Materials, Inc.
Priyadarshi Panda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
USING THREE-DIMENSIONAL REPRESENTATIONS FOR DEFECT-RELATED APPLICAT...
Publication number
20170161418
Publication date
Jun 8, 2017
KLA-Tencor Corporation
Allen Park
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Enhancing Inspection Sensitivity of an Insp...
Publication number
20160275671
Publication date
Sep 22, 2016
KLA-Tencor Corporation
Shifang Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IN-LINE WAFER EDGE INSPECTION, WAFER PRE-ALIGNMENT, AND WAFER CLEANING
Publication number
20150370175
Publication date
Dec 24, 2015
KLA-Tencor Corporation
Lena Nicolaides
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Measuring a Characteristic of a Substrate o...
Publication number
20140291516
Publication date
Oct 2, 2014
Mehran Nasser-Ghodsi
G01 - MEASURING TESTING
Information
Patent Application
Using Three-Dimensional Representations for Defect-Related Applicat...
Publication number
20120316855
Publication date
Dec 13, 2012
KLA-Tencor Corporation
Allen Park
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEFECT AMPLIFICATION FOR IMPROVED SENSITIVITY ON PATTERNED...
Publication number
20120113416
Publication date
May 10, 2012
KLA-Tencor Corporation
Steven R. Lange
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR MEASURING A CHARACTERISTIC OF A SUBSTRATE O...
Publication number
20080264905
Publication date
Oct 30, 2008
Mehran Nasser-Ghodsi
G01 - MEASURING TESTING
Information
Patent Application
Inspection system setup techniques
Publication number
20060025948
Publication date
Feb 2, 2006
KLA-Tencor Technologies Corporation
David Bruce Coldren
G05 - CONTROLLING REGULATING
Information
Patent Application
Methods and systems for measuring a characteristic of a substrate o...
Publication number
20050221229
Publication date
Oct 6, 2005
Mehran Nasser-Ghodsi
G01 - MEASURING TESTING
Information
Patent Application
Inspection system setup techniques
Publication number
20040038454
Publication date
Feb 26, 2004
KLA-Tencor Technologies Corporation
David Bruce Coldren
G05 - CONTROLLING REGULATING