Prashant K. Sonone

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Akola, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan testing of integrated circuits and on-chip modules
- Patent number 8,645,779
- Issue date Feb 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Rajan Aggarwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN TESTING OF INTEGRATED CIRCUITS AND ON-CHIP MODULES
- Publication number 20130346819
- Publication date Dec 26, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Rajan Aggarwal
- G01 - MEASURING TESTING