Prateek Singh

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Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
Compression-based scan test system
- Patent number 12,265,121
- Issue date Apr 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Communication logic to enhance area effectiveness for memory repair...
- Patent number 12,204,782
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Urmishkumar Karsanbhai Patel
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION LOGIC TO ENHANCE AREA EFFECTIVENESS FOR MEMORY REPAIR...
- Publication number 20240427514
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Urmishkumar Karsanbhai Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPRESSION-BASED SCAN TEST SYSTEM
- Publication number 20240393393
- Publication date Nov 28, 2024
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING