Praveen Elakkumanan

Person

White Plains, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,997,028
- Issue date Mar 31, 2015
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,429,576
- Issue date Apr 23, 2013
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,418,087
- Issue date Apr 9, 2013
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,239,790
- Issue date Aug 7, 2012
- International Business Machines Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,176,444
- Issue date May 8, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrically-driven optical proximity correction to compensate for...
- Patent number 8,103,983
- Issue date Jan 24, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,042,070
- Issue date Oct 18, 2011
- International Business Machines Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Electrically driven optical proximity correction
- Patent number 7,865,864
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20130238263
- Publication date Sep 12, 2013
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20120227019
- Publication date Sep 6, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...
- Publication number 20120144356
- Publication date Jun 7, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20110307846
- Publication date Dec 15, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analyzing Multiple Induced Systematic and Statistical Layout Depend...
- Publication number 20100269079
- Publication date Oct 21, 2010
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICALLY-DRIVEN OPTICAL PROXIMITY CORRECTION TO COMPENSATE FOR...
- Publication number 20100122231
- Publication date May 13, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICALLY DRIVEN OPTICAL PROXIMITY CORRECTION
- Publication number 20090199151
- Publication date Aug 6, 2009
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20090106714
- Publication date Apr 23, 2009
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING

Praveen Elakkumanan

Person

Patents Grantslast 30 patents

Methods and system for analysis and management of parametric yield

Methods and system for analysis and management of parametric yield

Analyzing multiple induced systematic and statistical layout depend...

Methods and system for analysis and management of parametric yield

Analyzing multiple induced systematic and statistical layout depend...

Electrically-driven optical proximity correction to compensate for...

Methods and system for analysis and management of parametric yield

Electrically driven optical proximity correction

Patents Applicationslast 30 patents

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

Analyzing Multiple Induced Systematic and Statistical Layout Depend...

ELECTRICALLY-DRIVEN OPTICAL PROXIMITY CORRECTION TO COMPENSATE FOR...

ELECTRICALLY DRIVEN OPTICAL PROXIMITY CORRECTION

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD