Praveen Pavithran

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Nijmegen, NL

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Patents Grantslast 30 patents

Information Patent Grant
On silicon interconnect capacitance extraction
- Patent number 7,791,357
- Issue date Sep 7, 2010
- NXP B.V.
- Praveen Pavithran
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On Silicon Interconnect Capacitance Extraction
- Publication number 20080143348
- Publication date Jun 19, 2008
- Koninklijke Philips Electronics N.V.
- Praveen Pavithran
- G01 - MEASURING TESTING