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Praveen Vedagarbha
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Laser-assisted device alteration using synchronized laser pulses
Patent number
11,353,479
Issue date
Jun 7, 2022
FEI EFA, Inc.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Grant
Laser-assisted device alteration using synchronized laser pulses
Patent number
10,209,274
Issue date
Feb 19, 2019
FEI EFA, Inc.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Grant
Laser-assisted device alteration using synchronized laser pulses
Patent number
9,201,096
Issue date
Dec 1, 2015
DCG Systems, Inc.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Grant
Laser assisted device alteration using two-photon absorption
Patent number
8,860,447
Issue date
Oct 14, 2014
DCG Systems, Inc.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Grant
Spatial and temporal selective laser assisted fault localization
Patent number
6,967,491
Issue date
Nov 22, 2005
Credence Systems Corporation
Philippe Perdu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES
Publication number
20200025799
Publication date
Jan 23, 2020
FEI EFA, Inc.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Application
LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES
Publication number
20160202313
Publication date
Jul 14, 2016
DCG SYSTEMS, INC.
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
Publication number
20140285227
Publication date
Sep 25, 2014
FREESCALE SEMICONDUCTOR, INC.
Keith Serrels
G01 - MEASURING TESTING
Information
Patent Application
LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES
Publication number
20130314116
Publication date
Nov 28, 2013
Praveen Vedagarbha
G01 - MEASURING TESTING
Information
Patent Application
LASER ASSISTED DEVICE ALTERATION USING TWO-PHOTON ABSORPTION
Publication number
20120056626
Publication date
Mar 8, 2012
DCG SYSTEMS, INC.
Praveen VEDAGARBHA
G01 - MEASURING TESTING
Information
Patent Application
Spatial and temporal selective laser assisted fault localization
Publication number
20050006602
Publication date
Jan 13, 2005
Philippe Perdu
G01 - MEASURING TESTING