Priyesh Kumar

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Pune, IN

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Patents Grantslast 30 patents

Information Patent Grant
At-speed scan testing of clock divider logic in a clock module of a...
- Patent number 8,898,527
- Issue date Nov 25, 2014
- LSI Corporation
- Priyesh Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic clock domain bypass for scan chains
- Patent number 8,812,921
- Issue date Aug 19, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Grant
Efficient wrapper cell design for scan testing of integrated
- Patent number 8,738,978
- Issue date May 27, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Grant
Low-power and area-efficient scan cell for integrated circuit testing
- Patent number 8,566,658
- Issue date Oct 22, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AT-SPEED SCAN TESTING OF CLOCK DIVIDER LOGIC IN A CLOCK MODULE OF A...
- Publication number 20140208175
- Publication date Jul 24, 2014
- LSI Corporation
- Priyesh Kumar
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST CIRCUITRY COMPRISING AT LEAST ONE SCAN CHAIN AND ASSOCIAT...
- Publication number 20140201584
- Publication date Jul 17, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
SCAN CONTROLLER CONFIGURED TO CONTROL SIGNAL VALUES APPLIED TO SIGN...
- Publication number 20130311843
- Publication date Nov 21, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC CLOCK DOMAIN BYPASS FOR SCAN CHAINS
- Publication number 20130103994
- Publication date Apr 25, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT WRAPPER CELL DESIGN FOR SCAN TESTING OF INTEGRATED CIRCUITS
- Publication number 20130007547
- Publication date Jan 3, 2013
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER AND AREA-EFFICIENT SCAN CELL FOR INTEGRATED CIRCUIT TESTING
- Publication number 20120246529
- Publication date Sep 27, 2012
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING