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Patents Grants
last 30 patents
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Patent Grant
Method of and circuit for brown-out detection
Patent number
9,594,099
Issue date
Mar 14, 2017
Semiconductor Components Industries, LLC
Joel Turchi
G01 - MEASURING TESTING
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Patent Grant
Method of and circuit for brown-out detection
Patent number
8,786,297
Issue date
Jul 22, 2014
Semiconductor Components Industries, LLC
Joel Turchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF AND CIRCUIT FOR BROWN-OUT DETECTION
Publication number
20150028916
Publication date
Jan 29, 2015
Semiconductor Components Industries, LLC
Joel Turchi
G01 - MEASURING TESTING
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Patent Application
METHOD OF AND CIRCUIT FOR BROWN-OUT DETECTION
Publication number
20120032695
Publication date
Feb 9, 2012
Joel Turchi
G01 - MEASURING TESTING