Péter REISCHIG

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Leicestershire, GB

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Patents Grantslast 30 patents

Information Patent Grant
Method of generating a fingerprint for a gemstone using x-ray imaging
- Patent number 11,073,488
- Issue date Jul 27, 2021
- Peter Reischig
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,288,570
- Issue date May 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,139,357
- Issue date Nov 27, 2018
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20190079032
- Publication date Mar 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF GENERATING A FINGERPRINT FOR A GEMSTONE USING X-RAY IMA...
- Publication number 20170343493
- Publication date Nov 30, 2017
- Peter Reischig
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20170038317
- Publication date Feb 9, 2017
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING