Pu Wei

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West Lafayette, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,837,455
- Issue date Dec 5, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,380,534
- Issue date Jul 5, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 10,720,316
- Issue date Jul 21, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 10,079,140
- Issue date Sep 18, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 9,704,700
- Issue date Jul 11, 2017
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20240170273
- Publication date May 23, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20220301844
- Publication date Sep 22, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20200312650
- Publication date Oct 1, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20190006167
- Publication date Jan 3, 2019
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20180033603
- Publication date Feb 1, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20170103879
- Publication date Apr 13, 2017
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS