Puneet Gupta

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test architecture for die to die interconnect for three dimensional...
- Patent number 11,257,560
- Issue date Feb 22, 2022
- Intel Corporation
- Sreejit Chakravarty
- G11 - INFORMATION STORAGE
Information Patent Grant
Smart diagnostics for hot-pluggable battery systems
- Patent number 10,283,975
- Issue date May 7, 2019
- Amazon Technologies, Inc.
- Vidhyananth Ramasamy Venkatasamy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Via resistance analysis systems and methods
- Patent number 9,496,853
- Issue date Nov 15, 2016
- NVIDIA Corporation
- Wojciech Jakub Poppe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Coupling resistance and capacitance analysis systems and methods
- Patent number 9,425,772
- Issue date Aug 23, 2016
- NVIDIA Corporation
- Wojciech Jakub Poppe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DESIGN FOR TEST ARCHITECTURE FOR DIE TO DIE INTERCONNECT FOR THREE...
- Publication number 20190096503
- Publication date Mar 28, 2019
- Intel Corporation
- Sreejit CHAKRAVARTY
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COUPLING RESISTANCE AND CAPACITANCE ANALYSIS SYSTEMS AND METHODS
- Publication number 20130027140
- Publication date Jan 31, 2013
- NVIDIA Corporation
- Wojciech Jakub Poppe
- G01 - MEASURING TESTING
Information Patent Application
VIA RESISTANCE ANALYSIS SYSTEMS AND METHODS
- Publication number 20130021107
- Publication date Jan 24, 2013
- NVIDIA Corporation
- Wojciech Jakub Poppe
- G01 - MEASURING TESTING