Punit Kishore

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
On-chip clock controller (OCC) manager based turbo capture clocking
- Patent number 11,237,587
- Issue date Feb 1, 2022
- QUALCOMM Incorporated
- Punit Kishore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time interleaved scan system
- Patent number 10,996,267
- Issue date May 4, 2021
- QUALCOMM Incorporated
- Jais Abraham
- G01 - MEASURING TESTING
Information Patent Grant
In-system structural testing of a system-on-chip (SoC) using a peri...
- Patent number 10,877,088
- Issue date Dec 29, 2020
- QUALCOMM Incorporated
- Punit Kishore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low pin count test controller
- Patent number 10,656,203
- Issue date May 19, 2020
- QUALCOMM Incorporated
- Punit Kishore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual access of input/output (I/O) for test via an on-chip star n...
- Patent number 10,241,148
- Issue date Mar 26, 2019
- NVIDIA Corporation
- Ashfaq Shaikh
- G01 - MEASURING TESTING
Information Patent Grant
Simulating scan tests with reduced resources
- Patent number 8,943,457
- Issue date Jan 27, 2015
- NVIDIA Corporation
- Amit Dinesh Sanghani
- G01 - MEASURING TESTING
Information Patent Grant
Optimized simulation technique for design verification of an electr...
- Patent number 8,726,205
- Issue date May 13, 2014
- NVIDIA Corporation
- Amanulla Khan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IN-SYSTEM STRUCTURAL TESTING OF A SYSTEM-ON-CHIP (SOC) USING A PERI...
- Publication number 20200241070
- Publication date Jul 30, 2020
- QUALCOMM Incorporated
- Punit KISHORE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME INTERLEAVED SCAN SYSTEM
- Publication number 20200233031
- Publication date Jul 23, 2020
- QUALCOMM Incorporated
- Jais ABRAHAM
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL ACCESS OF INPUT/OUTPUT (I/O) FOR TEST VIA AN ON-CHIP STAR N...
- Publication number 20170045575
- Publication date Feb 16, 2017
- NVIDIA Corporation
- Ashfaq SHAIKH
- G01 - MEASURING TESTING
Information Patent Application
Simulating Scan Tests with Reduced Resources
- Publication number 20100131910
- Publication date May 27, 2010
- NVIDIA Corporation
- Amit Dinesh Sanghani
- G01 - MEASURING TESTING