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Q Han PARK
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Seoul, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Anti-reflection coating and method of forming the same
Patent number
11,048,025
Issue date
Jun 29, 2021
Korea University Research and Business Foundation
Q Han Park
B32 - LAYERED PRODUCTS
Information
Patent Grant
Mass flow controller, apparatus for manufacturing semiconductor dev...
Patent number
10,845,232
Issue date
Nov 24, 2020
Samsung Electronics Co., Ltd.
Sangkil Lee
G01 - MEASURING TESTING
Information
Patent Grant
System and method for non-contact measurement of optoelectronic pro...
Patent number
10,481,188
Issue date
Nov 19, 2019
Korea Institute of Science and Technology
Minah Seo
G01 - MEASURING TESTING
Information
Patent Grant
Optical device including slot and apparatus employing the optical d...
Patent number
10,288,479
Issue date
May 14, 2019
Samsung Electronics Co., Ltd.
Jineun Kim
G02 - OPTICS
Information
Patent Grant
Optical devices and methods of controlling propagation directions o...
Patent number
9,499,400
Issue date
Nov 22, 2016
Samsung Electronics Co., Ltd.
Jin-eun Kim
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Polarized light emitting diode
Patent number
7,816,699
Issue date
Oct 19, 2010
Korea University Industrial & Academic Collaboration Foundation
Q-Han Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microgyroscope
Patent number
7,746,475
Issue date
Jun 29, 2010
Samsung Electronics Co., Ltd.
Q Han Park
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING SEMICONDUCTOR WAFER AND METHOD OF...
Publication number
20230103349
Publication date
Apr 6, 2023
Samsung Electronics Co., Ltd.
Q-Han PARK
G01 - MEASURING TESTING
Information
Patent Application
ANTI-REFLECTION COATING AND METHOD OF FORMING THE SAME
Publication number
20200081161
Publication date
Mar 12, 2020
Korea University Research and Business Foundation
Q Han PARK
G02 - OPTICS
Information
Patent Application
MASS FLOW CONTROLLER, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEV...
Publication number
20190170563
Publication date
Jun 6, 2019
Samsung Electronics Co., Ltd.
Sangkil Lee
G01 - MEASURING TESTING
Information
Patent Application
MONITORING APPARATUS AND SEMICONDUCTOR MANUFACTURING APPARATUS INCL...
Publication number
20190139796
Publication date
May 9, 2019
Samsung Electronics Co., Ltd.
Sang-kil LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MEASUREMENT OF OPTOELECTRONIC PRO...
Publication number
20190086458
Publication date
Mar 21, 2019
Korea Institute of Science and Technology
Minah SEO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE INCLUDING SLOT AND APPARATUS EMPLOYING THE OPTICAL D...
Publication number
20170370773
Publication date
Dec 28, 2017
Samsung Electronics Co., Ltd.
Jineun KIM
G02 - OPTICS
Information
Patent Application
OPTICAL DEVICES AND METHODS OF CONTROLLING PROPAGATION DIRECTIONS O...
Publication number
20130070459
Publication date
Mar 21, 2013
KOREA UNIVERSITY Industrial & Academic Collaboration Foundation
Jin-eun Kim
B82 - NANO-TECHNOLOGY
Information
Patent Application
LIGHT EMITTING DEVICE, LIGHT EMITTING DEVICE PACKAGE, AND LIGHT UNIT
Publication number
20120299047
Publication date
Nov 29, 2012
Tae Jin KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROGYROSCOPE
Publication number
20090091763
Publication date
Apr 9, 2009
Samsung Electronics Co., Ltd.
Q Han PARK
G01 - MEASURING TESTING
Information
Patent Application
POLARIZED LIGHT EMITTING DIODE
Publication number
20080290336
Publication date
Nov 27, 2008
Q-Han PARK
H01 - BASIC ELECTRIC ELEMENTS