Qi CHENG

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Focusing and leveling measurement device and method
- Patent number 10,656,507
- Issue date May 19, 2020
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Qi Cheng
- G02 - OPTICS
Information Patent Grant
Exposure device and out-of-focus and tilt error compensation method
- Patent number 10,197,923
- Issue date Feb 5, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Feibiao Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Integrated Structure of MOS Transistors Having Different Working Vo...
- Publication number 20230335641
- Publication date Oct 19, 2023
- Shanghai Huali Intergrated Circuit Corporation
- Qi Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TISSUE PROCESSOR
- Publication number 20230266210
- Publication date Aug 24, 2023
- LEICA BIOSYSTEMS NUSSLOCH GMBH
- Bin LIU
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus For Predicting Power Consumption, Device and R...
- Publication number 20230049089
- Publication date Feb 16, 2023
- ENVISION DIGITAL INTERNATIONAL PTE. LTD.
- Qi CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR RECOMMENDING PROTOCOL USED FOR TISSUE PROCESSING
- Publication number 20220005557
- Publication date Jan 6, 2022
- LEICA BIOSYSTEMS NUSSLOCH GMBH
- Li YIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCUSING AND LEVELING MEASUREMENT DEVICE AND METHOD
- Publication number 20190302582
- Publication date Oct 3, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Qi CHENG
- G01 - MEASURING TESTING
Information Patent Application
EXPOSURE DEVICE AND OUT-OF-FOCUS AND TILT ERROR COMPENSATION METHOD
- Publication number 20170219935
- Publication date Aug 3, 2017
- SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
- Feibiao CHEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Focusing and leveling measurement device and method

Exposure device and out-of-focus and tilt error compensation method

Patents Applicationslast 30 patents

Integrated Structure of MOS Transistors Having Different Working Vo...

TISSUE PROCESSOR

Method and Apparatus For Predicting Power Consumption, Device and R...

SYSTEM AND METHOD FOR RECOMMENDING PROTOCOL USED FOR TISSUE PROCESSING

FOCUSING AND LEVELING MEASUREMENT DEVICE AND METHOD

EXPOSURE DEVICE AND OUT-OF-FOCUS AND TILT ERROR COMPENSATION METHOD