Qi Gu

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Proble for testing integrated circuits
- Patent number 7,112,974
- Issue date Sep 26, 2006
- Cypress Semiconductor Corporation
- Bo Jin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with an adapter layer for testing integrated circuits
- Patent number 6,847,218
- Issue date Jan 25, 2005
- Cypress Semiconductor Corporation
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Grant
Array of dice for testing integrated circuits
- Patent number 6,759,865
- Issue date Jul 6, 2004
- Cypress Semiconductor Corporation
- Qi Gu
- G01 - MEASURING TESTING