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Qiang Chen
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Silicon-on-insulator (“SOI”) transistor test structure for measurin...
Patent number
8,586,981
Issue date
Nov 19, 2013
Advanced Micro Devices, Inc.
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Asymmetric transistor
Patent number
8,426,279
Issue date
Apr 23, 2013
GLOBALFOUNDRIES Inc.
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Body tie test structure for accurate body effect measurement
Patent number
8,293,606
Issue date
Oct 23, 2012
GLOBALFOUNDARIES, Inc.
Sriram Madhavan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SOI semiconductor components and methods for their fabrication
Patent number
7,986,008
Issue date
Jul 26, 2011
Advanced Micro Devices, Inc.
Ali Icel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Body tie test structure for accurate body effect measurement
Patent number
7,880,229
Issue date
Feb 1, 2011
GLOBALFOUNDRIES Inc.
Sriram Madhavan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for adjusting a transistor model for increased circuit simul...
Patent number
7,761,823
Issue date
Jul 20, 2010
Advanced Micro Devices, Inc.
Jung-Suk Goo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SOI semiconductor components and methods for their fabrication
Patent number
7,531,403
Issue date
May 12, 2009
Advanced Micro Devices, Inc.
Ali Icel
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT
Publication number
20110086484
Publication date
Apr 14, 2011
GLOBALFOUNDRIES INC.
Sriram MADHAVAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOI SEMICONDUCTOR COMPONENTS AND METHODS FOR THEIR FABRICATION
Publication number
20090184372
Publication date
Jul 23, 2009
Advanced Micro Devices, Inc.
Ali ICEL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT
Publication number
20090101976
Publication date
Apr 23, 2009
Advanced Micro Devices, Inc.
Sriram MADHAVAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for adjusting a transistor model for increased circuit simul...
Publication number
20080286887
Publication date
Nov 20, 2008
Advanced Micro Devices, Inc.
Jung-Suk Goo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Silicon-on-insulator ("SOI") transistor test structure for measurin...
Publication number
20080185581
Publication date
Aug 7, 2008
Advanced Micro Devices, Inc.
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOI SEMICONDUCTOR COMPONENTS AND METHODS FOR THEIR FABRICATION
Publication number
20080079074
Publication date
Apr 3, 2008
Ali Icel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Asymmetric transistor
Publication number
20080057635
Publication date
Mar 6, 2008
Advanced Micro Devices, Inc.
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS