Qiang Peng

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Narusawa-mura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance pressure sensor
- Patent number 8,714,022
- Issue date May 6, 2014
- Canon Anelva Corporation
- Qiang Peng
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring mean free path, vacuum gauge, and method for m...
- Patent number 8,436,295
- Issue date May 7, 2013
- Canon Anelva Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Grant
Ion detector for mass spectrometry, method for detecting ion, and m...
- Patent number 8,410,415
- Issue date Apr 2, 2013
- Canon Anelva Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,324,568
- Issue date Dec 4, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...
- Publication number 20120235034
- Publication date Sep 20, 2012
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Application
ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND M...
- Publication number 20120097847
- Publication date Apr 26, 2012
- Canon ANELVA Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE PRESSURE SENSOR
- Publication number 20120024075
- Publication date Feb 2, 2012
- Canon ANELVA Corporation
- Qiang Peng
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20100243884
- Publication date Sep 30, 2010
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS