Qiang Wu

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for phase/amplitude error detection of alternatin...
- Patent number 7,171,034
- Issue date Jan 30, 2007
- International Business Machines Corporation
- Qiang Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer alignment system using parallel imaging detection
- Patent number 6,950,188
- Issue date Sep 27, 2005
- International Business Machines Corporation
- Qiang Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron beam array write head system and method
- Patent number 6,891,169
- Issue date May 10, 2005
- International Business Machines Corporation
- Scott Josef Bukofsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process-robust alignment mark structure for semiconductor wafers
- Patent number 6,803,668
- Issue date Oct 12, 2004
- International Business Machines Corporation
- Karen L. Holloway
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Wafer processing techniques with enhanced alignment
- Publication number 20050059255
- Publication date Mar 17, 2005
- Infineon Technologies North America Corp.
- Lawrence John Varnerin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wafer Alignment System Using Parallel Imaging Detection
- Publication number 20040212801
- Publication date Oct 28, 2004
- International Business Machines Corporation
- Qiang Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron beam array write head system and method
- Publication number 20040140437
- Publication date Jul 22, 2004
- International Business Machines Corporation
- Scott Josef Bukofsky
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and system for phase/amplitude error detection of alternatin...
- Publication number 20040105577
- Publication date Jun 3, 2004
- International Business Machines Corporation
- Qiang Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process-robust alignment mark structure for semiconductor wafers
- Publication number 20040099963
- Publication date May 27, 2004
- International Business Machines Corporation
- Karen L. Holloway
- H01 - BASIC ELECTRIC ELEMENTS