Qiangmin WEI

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Wuhan, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for tilting characterization by microscopy
- Patent number 12,078,791
- Issue date Sep 3, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for polysilicon characterization
- Patent number 11,467,084
- Issue date Oct 11, 2022
- Yangtze Memory Technologies Co., Ltd.
- Junzhan Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TILTING CHARACTERIZATION BY MICROSCOPY
- Publication number 20230073472
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR POLYSILICON CHARACTERIZATION
- Publication number 20200400555
- Publication date Dec 24, 2020
- Yangtze Memory Technologies Co., Ltd.
- Junzhan LIU
- G01 - MEASURING TESTING