Qiliang Yan

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Lithography improvement based on defect probability distributions a...
- Patent number 11,314,171
- Issue date Apr 26, 2022
- Synopsys, Inc.
- Lawrence S. Melvin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated mask-aware lithography modeling to support off-axis illu...
- Patent number 10,691,015
- Issue date Jun 23, 2020
- Hongbo Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Producing mask layouts with rounded corners
- Patent number 10,635,776
- Issue date Apr 28, 2020
- Synopsys, Inc.
- Qiliang Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated mask-aware lithography modeling to support off-axis illu...
- Patent number 9,354,511
- Issue date May 31, 2016
- Synopsys, Inc.
- Hongbo Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
MASK3D model accuracy enhancement for small feature coupling effect
- Patent number 9,348,964
- Issue date May 24, 2016
- Synopsys, Inc.
- Hongbo Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast 3D mask model based on implicit countors
- Patent number 8,972,229
- Issue date Mar 3, 2015
- Synopsys, Inc.
- Zhijie Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge-based full chip mask topography modeling
- Patent number 8,918,743
- Issue date Dec 23, 2014
- Synopsys, Inc.
- Qiliang Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compact and accurate wafer topography proximity effect modeling for...
- Patent number 8,719,736
- Issue date May 6, 2014
- Synopsys, Inc.
- Hongbo Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Evaluating the quality of an assist feature placement based on a fo...
- Patent number 8,296,688
- Issue date Oct 23, 2012
- Synopsys, Inc.
- Levi D. Barnes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining an optical threshold and a res...
- Patent number 8,184,897
- Issue date May 22, 2012
- Synopsys, Inc.
- Jianliang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Assist feature placement based on a focus-sensitive cost-covariance...
- Patent number 7,954,071
- Issue date May 31, 2011
- Synopsys, Inc.
- Levi D. Barnes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for correlating physical model representation to...
- Patent number 7,933,471
- Issue date Apr 26, 2011
- Synopsys, Inc.
- Jianliang Li
- G02 - OPTICS
Information Patent Grant
Method and apparatus for identifying a manufacturing problem area i...
- Patent number 7,784,018
- Issue date Aug 24, 2010
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining a process model using a 2-D-pa...
- Patent number 7,739,645
- Issue date Jun 15, 2010
- Synopsys, Inc.
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for quickly determining the effect of placing...
- Patent number 7,721,246
- Issue date May 18, 2010
- Synopsys, Inc.
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for modeling an apodization effect in an optic...
- Patent number 7,681,172
- Issue date Mar 16, 2010
- Synopsys, Inc.
- Qiaolin Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for assessing the quality of a process model
- Patent number 7,496,880
- Issue date Feb 24, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for identifying a problem edge in a mask layou...
- Patent number 7,320,119
- Issue date Jan 15, 2008
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for correcting 3D mask effects
- Patent number 7,308,673
- Issue date Dec 11, 2007
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for identifying a manufacturing problem area i...
- Patent number 7,243,332
- Issue date Jul 10, 2007
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LITHOGRAPHY IMPROVEMENT BASED ON DEFECT PROBABILITY DISTRIBUTIONS A...
- Publication number 20210088913
- Publication date Mar 25, 2021
- Synopsys, Inc.
- Lawrence S. Melvin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTEGRATED MASK-AWARE LITHOGRAPHY MODELING TO SUPPORT OFF-AXIS ILLU...
- Publication number 20160349608
- Publication date Dec 1, 2016
- Synopsys, Inc.
- Hongbo Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK3D MODEL ACCURACY ENHANCEMENT FOR SMALL FEATURE COUPLING EFFECT
- Publication number 20150302132
- Publication date Oct 22, 2015
- Synopsys, Inc.
- Hongbo Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED MASK-AWARE LITHOGRAPHY MODELING TO SUPPORT OFF-AXIS ILLU...
- Publication number 20150161302
- Publication date Jun 11, 2015
- Synopsys, Inc.
- Hongbo Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fast 3D Mask Model Based on Implicit Countors
- Publication number 20140032199
- Publication date Jan 30, 2014
- Synopsys, Inc.
- Zhijie Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING THE QUALITY OF AN ASSIST FEATURE PLACEMENT BASED ON A FO...
- Publication number 20110202891
- Publication date Aug 18, 2011
- Synopsys, Inc.
- Levi D. Barnes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING AN OPTICAL THRESHOLD AND A RES...
- Publication number 20100086196
- Publication date Apr 8, 2010
- Synopsys, Inc.
- Jianliang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for determining a process model using a 2-D-pa...
- Publication number 20080276211
- Publication date Nov 6, 2008
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for correlating physical model representation to...
- Publication number 20080219590
- Publication date Sep 11, 2008
- Jianliang Li
- G02 - OPTICS
Information Patent Application
Method and apparatus for modeling an apodization effect in an optic...
- Publication number 20080184192
- Publication date Jul 31, 2008
- Qiaolin Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for identifying a manufacturing problem area i...
- Publication number 20070250804
- Publication date Oct 25, 2007
- Lawrence S. Melvin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for quickly determining the effect of placing...
- Publication number 20070038973
- Publication date Feb 15, 2007
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for assessing the quality of a process model
- Publication number 20060236297
- Publication date Oct 19, 2006
- Lawrence S. Melvin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for identifying a problem edge in a mask layou...
- Publication number 20060190914
- Publication date Aug 24, 2006
- Lawrence S. Melvin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for identifying a manufacturing problem area i...
- Publication number 20060190913
- Publication date Aug 24, 2006
- Lawrence S. Melvin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for correcting 3D mask effects
- Publication number 20060156270
- Publication date Jul 13, 2006
- Lawrence S. Melvin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Qiliang Yan

Person

Patents Grantslast 30 patents

Lithography improvement based on defect probability distributions a...

Integrated mask-aware lithography modeling to support off-axis illu...

Producing mask layouts with rounded corners

Integrated mask-aware lithography modeling to support off-axis illu...

MASK3D model accuracy enhancement for small feature coupling effect

Fast 3D mask model based on implicit countors

Edge-based full chip mask topography modeling

Compact and accurate wafer topography proximity effect modeling for...

Evaluating the quality of an assist feature placement based on a fo...

Method and apparatus for determining an optical threshold and a res...

Assist feature placement based on a focus-sensitive cost-covariance...

Method and system for correlating physical model representation to...

Method and apparatus for identifying a manufacturing problem area i...

Method and apparatus for determining a process model using a 2-D-pa...

Method and apparatus for quickly determining the effect of placing...

Method and apparatus for modeling an apodization effect in an optic...

Method and apparatus for assessing the quality of a process model

Method and apparatus for identifying a problem edge in a mask layou...

Method and apparatus for correcting 3D mask effects

Method and apparatus for identifying a manufacturing problem area i...

Patents Applicationslast 30 patents

LITHOGRAPHY IMPROVEMENT BASED ON DEFECT PROBABILITY DISTRIBUTIONS A...

INTEGRATED MASK-AWARE LITHOGRAPHY MODELING TO SUPPORT OFF-AXIS ILLU...

MASK3D MODEL ACCURACY ENHANCEMENT FOR SMALL FEATURE COUPLING EFFECT

INTEGRATED MASK-AWARE LITHOGRAPHY MODELING TO SUPPORT OFF-AXIS ILLU...

Fast 3D Mask Model Based on Implicit Countors

EVALUATING THE QUALITY OF AN ASSIST FEATURE PLACEMENT BASED ON A FO...

METHOD AND APPARATUS FOR DETERMINING AN OPTICAL THRESHOLD AND A RES...

Method and apparatus for determining a process model using a 2-D-pa...

Method and system for correlating physical model representation to...

Method and apparatus for modeling an apodization effect in an optic...

Method and apparatus for identifying a manufacturing problem area i...

Method and apparatus for quickly determining the effect of placing...

Method and apparatus for assessing the quality of a process model

Method and apparatus for identifying a problem edge in a mask layou...

Method and apparatus for identifying a manufacturing problem area i...

Method and apparatus for correcting 3D mask effects