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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Circuit for monitoring metal degradation on integrated circuit
Patent number
9,733,302
Issue date
Aug 15, 2017
NXP USA, INC.
Zhichen Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring system for detecting degradation of integrated circuit
Patent number
9,222,968
Issue date
Dec 29, 2015
FREESCALE SEMICONDUCTOR, INC.
Zhichen Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT FOR MONITORING METAL DEGRADATION ON INTEGRATED CIRCUIT
Publication number
20160216318
Publication date
Jul 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Zhichen Zhang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CIRCUIT RELIABILITY AGING
Publication number
20150234961
Publication date
Aug 20, 2015
Zhichen Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MONITORING SYSTEM FOR DETECTING DEGRADATION OF INTEGRATED CIRCUIT
Publication number
20140191777
Publication date
Jul 10, 2014
Zhichen Zhang
G01 - MEASURING TESTING