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last 30 patents
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Patent Grant
Electronic device and method
Patent number
12,352,866
Issue date
Jul 8, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing Ding
G01 - MEASURING TESTING
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Patent Grant
Time-of-flight apparatus and method
Patent number
11,835,659
Issue date
Dec 5, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing Ding
G01 - MEASURING TESTING
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Patent Grant
Electronic device, method and computer program
Patent number
11,681,026
Issue date
Jun 20, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing Ding
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Electronic device and method
Patent number
11,520,020
Issue date
Dec 6, 2022
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing Ding
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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last 30 patents
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Patent Application
TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT READOUT METHOD
Publication number
20250039582
Publication date
Jan 30, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing DING
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TIME-OF-FLIGHT DEMODULATION CIRCUITRY, TIME-OF-FLIGHT DEMODULATION...
Publication number
20240175997
Publication date
May 30, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Ferhat TASDEMIR
G01 - MEASURING TESTING
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Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
Publication number
20240134014
Publication date
Apr 25, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Cecilia GIMENO
G01 - MEASURING TESTING
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Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
Publication number
20230188870
Publication date
Jun 15, 2023
Sony Semiconductor Solutions Corporation
Qing DING
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TIME-OF-FLIGHT APPARATUS AND METHOD
Publication number
20220179087
Publication date
Jun 9, 2022
Sony Semiconductor Solutions Corporation
Rachit Mohan
G01 - MEASURING TESTING
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Patent Application
TIME OF FLIGHT DEVICE AND METHOD
Publication number
20220146673
Publication date
May 12, 2022
Sony Semiconductor Solutions Corporation
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD
Publication number
20210318443
Publication date
Oct 14, 2021
Sony Semiconductor Solutions Corporation
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT APPARATUS AND METHOD
Publication number
20200264285
Publication date
Aug 20, 2020
Sony Semiconductor Solutions Corporation
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
Publication number
20200018833
Publication date
Jan 16, 2020
Sony Semiconductor Solutions Corporation
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD
Publication number
20190204446
Publication date
Jul 4, 2019
Sony Semiconductor Solutions Corporation
Qing Ding
G01 - MEASURING TESTING