Qing Ding

Person

Stuttgart, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight apparatus and method
- Patent number 11,835,659
- Issue date Dec 5, 2023
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, method and computer program
- Patent number 11,681,026
- Issue date Jun 20, 2023
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Qing Ding
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic device and method
- Patent number 11,520,020
- Issue date Dec 6, 2022
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Qing Ding
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT READOUT METHOD
- Publication number 20250039582
- Publication date Jan 30, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Qing DING
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TIME-OF-FLIGHT DEMODULATION CIRCUITRY, TIME-OF-FLIGHT DEMODULATION...
- Publication number 20240175997
- Publication date May 30, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Ferhat TASDEMIR
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
- Publication number 20240134014
- Publication date Apr 25, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Cecilia GIMENO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
- Publication number 20230188870
- Publication date Jun 15, 2023
- Sony Semiconductor Solutions Corporation
- Qing DING
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TIME-OF-FLIGHT APPARATUS AND METHOD
- Publication number 20220179087
- Publication date Jun 9, 2022
- Sony Semiconductor Solutions Corporation
- Rachit Mohan
- G01 - MEASURING TESTING
Information Patent Application
TIME OF FLIGHT DEVICE AND METHOD
- Publication number 20220146673
- Publication date May 12, 2022
- Sony Semiconductor Solutions Corporation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD
- Publication number 20210318443
- Publication date Oct 14, 2021
- Sony Semiconductor Solutions Corporation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT APPARATUS AND METHOD
- Publication number 20200264285
- Publication date Aug 20, 2020
- Sony Semiconductor Solutions Corporation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
- Publication number 20200018833
- Publication date Jan 16, 2020
- Sony Semiconductor Solutions Corporation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD
- Publication number 20190204446
- Publication date Jul 4, 2019
- Sony Semiconductor Solutions Corporation
- Qing Ding
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Time-of-flight apparatus and method

Electronic device, method and computer program

Electronic device and method

Patents Applicationslast 30 patents

TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT READOUT METHOD

TIME-OF-FLIGHT DEMODULATION CIRCUITRY, TIME-OF-FLIGHT DEMODULATION...

ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM

ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM

TIME-OF-FLIGHT APPARATUS AND METHOD

TIME OF FLIGHT DEVICE AND METHOD

ELECTRONIC DEVICE AND METHOD

TIME-OF-FLIGHT APPARATUS AND METHOD

ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM

ELECTRONIC DEVICE AND METHOD