Qing Luo

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection using structural information
- Patent number 9,727,047
- Issue date Aug 8, 2017
- KLA-Tencor Corp.
- Qing Luo
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Detection Using Structural Information
- Publication number 20160104600
- Publication date Apr 14, 2016
- KLA-Tencor Corporation
- Qing Luo
- H01 - BASIC ELECTRIC ELEMENTS