Qing Su

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Enhanced glitch estimation in vectorless power analysis
- Patent number 12,001,768
- Issue date Jun 4, 2024
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Glitch source identification and ranking
- Patent number 11,651,131
- Issue date May 16, 2023
- Synopsys, Inc.
- Vaibhav Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vector generation for maximum instantaneous peak power
- Patent number 11,531,797
- Issue date Dec 20, 2022
- Synopsys, Inc.
- Youxin Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD/antenna diodes for through-silicon vias
- Patent number 8,999,766
- Issue date Apr 7, 2015
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD/antenna diodes for through-silicon vias
- Patent number 8,877,638
- Issue date Nov 4, 2014
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Banded computation architectures
- Patent number 8,762,918
- Issue date Jun 24, 2014
- Synopsys, Inc.
- Min Ni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Convolution computation for many-core processor architectures
- Patent number 8,458,635
- Issue date Jun 4, 2013
- Synopsys, Inc.
- Min Ni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD/antenna diodes for through-silicon vias
- Patent number 8,264,065
- Issue date Sep 11, 2012
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast evaluation of average critical area for IC layouts
- Patent number 8,205,179
- Issue date Jun 19, 2012
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast evaluation of average critical area for IC layouts
- Patent number 8,205,185
- Issue date Jun 19, 2012
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Steiner tree based approach for polygon fracturing
- Patent number 8,151,236
- Issue date Apr 3, 2012
- Synopsys, Inc.
- Qing Su
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Predicting IC manufacturing yield by considering both systematic an...
- Patent number 8,000,826
- Issue date Aug 16, 2011
- Synopsys, Inc.
- Jianfeng Luo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fast evaluation of average critical area for ic layouts
- Patent number 7,962,873
- Issue date Jun 14, 2011
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast evaluation of average critical area for IC layouts
- Patent number 7,962,882
- Issue date Jun 14, 2011
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting IC manufacturing yield based on hotspots
- Patent number 7,707,526
- Issue date Apr 27, 2010
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrostatic-discharge protection using a micro-electromechanical-...
- Patent number 7,679,872
- Issue date Mar 16, 2010
- Synopsys, Inc.
- Jamil Kawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to reduce random yield loss
- Patent number 7,543,255
- Issue date Jun 2, 2009
- Synopsys, Inc.
- Subarnarekha Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast evaluation of average critical area for IC layouts
- Patent number 7,346,865
- Issue date Mar 18, 2008
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulating topography of a conductive material in a semiconductor w...
- Patent number 7,289,933
- Issue date Oct 30, 2007
- Synopsys, Inc.
- Jianfeng Luo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
GLITCH SOURCE IDENTIFICATION AND RANKING
- Publication number 20210406438
- Publication date Dec 30, 2021
- Synopsys, Inc.
- Vaibhav JAIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS
- Publication number 20140109027
- Publication date Apr 17, 2014
- Synopsys, Inc.
- Qing Su Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BANDED COMPUTATION ARCHITECTURES
- Publication number 20130263076
- Publication date Oct 3, 2013
- Min Ni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS
- Publication number 20120295433
- Publication date Nov 22, 2012
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONVOLUTION COMPUTATION FOR MANY-CORE PROCESSOR ARCHITECTURES
- Publication number 20110138157
- Publication date Jun 9, 2011
- Synopsys, Inc.
- MIN NI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS
- Publication number 20110095367
- Publication date Apr 28, 2011
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC-DISCHARGE PROTECTION USING A MICRO-ELECTROMECHANICAL-...
- Publication number 20100014199
- Publication date Jan 21, 2010
- Synopsys, Inc.
- Jamil Kawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC LAYOUTS
- Publication number 20090307641
- Publication date Dec 10, 2009
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC LAYOUTS
- Publication number 20090307644
- Publication date Dec 10, 2009
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STEINER TREE BASED APPROACH FOR POLYGON FRACTURING
- Publication number 20090187876
- Publication date Jul 23, 2009
- Synopsis, Inc.
- Qing Su
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Predicting IC manufacturing yield based on hotspots
- Publication number 20080295046
- Publication date Nov 27, 2008
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC
- Publication number 20080216028
- Publication date Sep 4, 2008
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC
- Publication number 20080148196
- Publication date Jun 19, 2008
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus to reduce random yield loss
- Publication number 20070192751
- Publication date Aug 16, 2007
- Subarnarekha Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predicting IC manufacturing yield by considering both systematic an...
- Publication number 20070174797
- Publication date Jul 26, 2007
- Jianfeng Luo
- G05 - CONTROLLING REGULATING
Information Patent Application
Simulating topography of a conductive material in a semiconductor w...
- Publication number 20070118320
- Publication date May 24, 2007
- SYNOPSYS, INC.
- Jianfeng Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fast evaluation of average critical area for IC layouts
- Publication number 20060095877
- Publication date May 4, 2006
- Synopsys, Inc.
- Qing Su
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Enhanced glitch estimation in vectorless power analysis

Glitch source identification and ranking

Vector generation for maximum instantaneous peak power

ESD/antenna diodes for through-silicon vias

ESD/antenna diodes for through-silicon vias

Banded computation architectures

Convolution computation for many-core processor architectures

ESD/antenna diodes for through-silicon vias

Fast evaluation of average critical area for IC layouts

Fast evaluation of average critical area for IC layouts

Steiner tree based approach for polygon fracturing

Predicting IC manufacturing yield by considering both systematic an...

Fast evaluation of average critical area for ic layouts

Fast evaluation of average critical area for IC layouts

Predicting IC manufacturing yield based on hotspots

Electrostatic-discharge protection using a micro-electromechanical-...

Method and apparatus to reduce random yield loss

Fast evaluation of average critical area for IC layouts

Simulating topography of a conductive material in a semiconductor w...

Patents Applicationslast 30 patents

GLITCH SOURCE IDENTIFICATION AND RANKING

ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS

BANDED COMPUTATION ARCHITECTURES

ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS

CONVOLUTION COMPUTATION FOR MANY-CORE PROCESSOR ARCHITECTURES

ESD/ANTENNA DIODES FOR THROUGH-SILICON VIAS

ELECTROSTATIC-DISCHARGE PROTECTION USING A MICRO-ELECTROMECHANICAL-...

FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC LAYOUTS

FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC LAYOUTS

STEINER TREE BASED APPROACH FOR POLYGON FRACTURING

Predicting IC manufacturing yield based on hotspots

FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC

FAST EVALUATION OF AVERAGE CRITICAL AREA FOR IC

Method and apparatus to reduce random yield loss

Predicting IC manufacturing yield by considering both systematic an...

Simulating topography of a conductive material in a semiconductor w...

Fast evaluation of average critical area for IC layouts