Qingfeng Wang

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
High voltage transistor using diluted drain
- Patent number 8,530,296
- Issue date Sep 10, 2013
- Texas Instruments Incorporated
- Pinghai Hao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage transistor using diluted drain
- Patent number 8,399,924
- Issue date Mar 19, 2013
- Texas Instruments Incorporated
- Pinghai Hao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using electrical test structure for semiconductor trench...
- Patent number 7,989,232
- Issue date Aug 2, 2011
- Texas Instruments Incorporated
- Qingfeng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of employing a thin oxide mask for high dose implants
- Patent number 7,785,974
- Issue date Aug 31, 2010
- Texas Instruments Incorporated
- Binghua Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LDMOS transistor double diffused region formation process
- Patent number 7,713,825
- Issue date May 11, 2010
- Texas Instruments Incorporated
- Binghua Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting epitaxial (EPI) induced buried layer shifts in...
- Patent number 7,112,953
- Issue date Sep 26, 2006
- Texas Instruments Incorporated
- Xinfen Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH VOLTAGE TRANSISTOR USING DILUTED DRAIN
- Publication number 20130157429
- Publication date Jun 20, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Pinghai Hao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE TRANSISTOR USING DILUTED DRAIN
- Publication number 20110309440
- Publication date Dec 22, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Pinghai Hao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIQUE LDMOS PROCESS INTEGRATION
- Publication number 20080293206
- Publication date Nov 27, 2008
- Binghua Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF USING ELECTRICAL TEST STRUCTURE FOR SEMICONDUCTOR TRENCH...
- Publication number 20080085569
- Publication date Apr 10, 2008
- Qingfeng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of employing a thin oxide mask for high dose implants
- Publication number 20070298579
- Publication date Dec 27, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Binghua Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for detecting EPI induced buried layer shifts in semiconduct...
- Publication number 20060038553
- Publication date Feb 23, 2006
- Texas Instruments, Inc.
- Xinfen Chen
- H01 - BASIC ELECTRIC ELEMENTS