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Tsukuba-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Residual thermal strain measurement method, residual thermal strain...
Patent number
11,674,793
Issue date
Jun 13, 2023
Namics Corporation
Qinghua Wang
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape, displacement, and strain measurement devic...
Patent number
10,655,954
Issue date
May 19, 2020
National Institute of Advanced Industrial Science and Technology
Qinghua Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
RESIDUAL THERMAL STRAIN MEASUREMENT METHOD, RESIDUAL THERMAL STRAIN...
Publication number
20200056880
Publication date
Feb 20, 2020
NAMICS CORPORATION
Qinghua WANG
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE, DISPLACEMENT, AND STRAIN MEASUREMENT DEVIC...
Publication number
20190212130
Publication date
Jul 11, 2019
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Qinghua WANG
G01 - MEASURING TESTING