Qingpo Xi

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Metal seal for ultra high vacuum system
- Patent number 9,605,759
- Issue date Mar 28, 2017
- Hermes Microvision Inc.
- Qingpo Xi
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Metal seal for ultra high vacuum system
- Patent number 9,581,245
- Issue date Feb 28, 2017
- Hermes-Microvision, Inc.
- Qingpo Xi
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
High efficiency secondary and back scattered electron detector
- Patent number 8,895,935
- Issue date Nov 25, 2014
- Hermes-Microvision, Inc.
- Zhibin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus
- Patent number 7,960,697
- Issue date Jun 14, 2011
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METAL SEAL FOR ULTRA HIGH VACUUM SYSTEM
- Publication number 20150091258
- Publication date Apr 2, 2015
- HERMES MICROVISION, INC.
- Qingpo XI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
METAL SEAL FOR ULTRA HIGH VACUUM SYSTEM
- Publication number 20130257044
- Publication date Oct 3, 2013
- Hermes Microvision, Inc.
- Qingpo XI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
HIGH EFFICIENCY SECONDARY AND BACK SCATTERED ELECTRON DETECTOR
- Publication number 20130234032
- Publication date Sep 12, 2013
- HERMES MICROVISION, INC.
- Zhibin Wang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20100102227
- Publication date Apr 29, 2010
- HERMES-MICROVISION, INC
- ZHONGWEI CHEN
- H01 - BASIC ELECTRIC ELEMENTS