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last 30 patents
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Patent Grant
High speed measurement of random variation/yield in integrated circ...
Patent number
8,456,169
Issue date
Jun 4, 2013
International Business Machines Corporation
Manjul Bhushan
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...
Publication number
20110169499
Publication date
Jul 14, 2011
International Business Machines Corporation
Manjul Bhushan
G01 - MEASURING TESTING