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Qingsong YANG
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Troy, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Image reconstruction method for computed tomography
Patent number
12,154,193
Issue date
Nov 26, 2024
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deep neural network for CT metal artifact reduction
Patent number
11,872,070
Issue date
Jan 16, 2024
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deep neural network for CT metal artifact reduction
Patent number
11,589,834
Issue date
Feb 28, 2023
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image reconstruction method for computed tomography
Patent number
11,423,591
Issue date
Aug 23, 2022
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for stationary computed tomography
Patent number
11,399,780
Issue date
Aug 2, 2022
Rensselaer Polytechnic Institute
Ge Wang
G01 - MEASURING TESTING
Information
Patent Grant
Stationary in-vivo grating-enabled micro-CT architecture (sigma)
Patent number
11,382,574
Issue date
Jul 12, 2022
Rensselaer Polytechnic Institute
Ge Wang
G01 - MEASURING TESTING
Information
Patent Grant
Tomographic image reconstruction via machine learning
Patent number
10,970,887
Issue date
Apr 6, 2021
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Attenuation map reconstruction from TOF PET data
Patent number
10,537,299
Issue date
Jan 21, 2020
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic bowtie filter for cone-beam/multi-slice CT
Patent number
10,092,257
Issue date
Oct 9, 2018
Rensselaer Polytechnic Institute
Ge Wang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Attenuation map reconstruction from TOF PET data
Patent number
9,600,910
Issue date
Mar 21, 2017
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DEEP NEURAL NETWORK FOR CT METAL ARTIFACT REDUCTION
Publication number
20230181141
Publication date
Jun 15, 2023
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE RECONSTRUCTION METHOD FOR COMPUTED TOMOGRAPHY
Publication number
20220405989
Publication date
Dec 22, 2022
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE RECONSTRUCTION METHOD FOR COMPUTED TOMOGRAPHY
Publication number
20210287407
Publication date
Sep 16, 2021
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEEP NEURAL NETWORK FOR CT METAL ARTIFACT REDUCTION
Publication number
20210000438
Publication date
Jan 7, 2021
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STATIONARY IN-VIVO GRATING-ENABLED MICRO-CT ARCHITECTURE (SIGMA)
Publication number
20200261030
Publication date
Aug 20, 2020
Rensselaer Polytechnic Institute
Ge Wang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHODS AND SYSTEMS FOR STATIONARY COMPUTED TOMOGRAPHY
Publication number
20190261930
Publication date
Aug 29, 2019
Rensselaer Polytechnic Institute
Ge Wang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ATTENUATION MAP RECONSTRUCTION FROM TOF PET DATA
Publication number
20180353147
Publication date
Dec 13, 2018
RENSSELAER POLYTECHNIC INSTITUTE
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DYNAMIC BOWTIE FILTER FOR CONE-BEAM/MULTI-SLICE CT
Publication number
20160113602
Publication date
Apr 28, 2016
Rensselaer Polytechnic Institute
Ge Wang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ATTENUATION MAP RECONSTRUCTION FROM TOF PET DATA
Publication number
20150193927
Publication date
Jul 9, 2015
Rensselaer Polytechnic Institute
Ge WANG
G01 - MEASURING TESTING