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Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscope based instrumentation for probing nanoscale...
- Patent number 11,016,118
- Issue date May 25, 2021
- SOUTH DAKOTA UNIVERSITY
- Qiquan Qiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPE BASED INSTRUMENTATION FOR PROBING NANOSCALE...
- Publication number 20200371135
- Publication date Nov 26, 2020
- SOUTH DAKOTA STATE UNIVERSITY
- Qiquan QIAO
- G01 - MEASURING TESTING