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last 30 patents
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Patent Grant
Target holder assembly of ion probe and method for preparing sample...
Patent number
11,387,088
Issue date
Jul 12, 2022
INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES (IGGCAS)
Jiao Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for measuring inert gas by ion probe
Patent number
11,101,126
Issue date
Aug 24, 2021
INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
Yu Liu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Target Holder Assembly of Ion Probe and Method for Preparing Sample...
Publication number
20210280405
Publication date
Sep 9, 2021
INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES (IGGCAS)
Jiao LI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE
Publication number
20210057204
Publication date
Feb 25, 2021
Institute of Geology and Geophysics, Chinese Academy of Sciences
Yu LIU
H01 - BASIC ELECTRIC ELEMENTS