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Quentin de Robillard
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Dresden, DE
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Patents Grants
last 30 patents
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Patent Grant
System and method for inspecting a semiconductor sample
Patent number
7,351,967
Issue date
Apr 1, 2008
Advanced Micro Devices, Inc.
Quentin De Robillard
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
System and method for inspecting a semiconductor sample
Publication number
20060219902
Publication date
Oct 5, 2006
Quentin De Robillard
G01 - MEASURING TESTING
Information
Patent Application
Method for objective and accurate thickness measurement of thin fil...
Publication number
20030222215
Publication date
Dec 4, 2003
Quentin de Robillard
G01 - MEASURING TESTING