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Quentin Walker
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Freemont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
Patent number
11,874,234
Issue date
Jan 16, 2024
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
Patent number
11,585,764
Issue date
Feb 21, 2023
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed plasma monitoring using optical sensor and a signal analyzer...
Patent number
9,200,950
Issue date
Dec 1, 2015
Applied Materials, Inc.
Lei Lian
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calibrating mass flow controllers
Patent number
8,089,046
Issue date
Jan 3, 2012
Applied Materials, Inc.
Matthew F. Davis
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatic determination of substrates states in plasma p...
Patent number
7,393,459
Issue date
Jul 1, 2008
Applied Materials, Inc.
Matthew F Davis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MULTI-LEVEL RF PULSE MONITORING AND RF PULSING PARAMETER OPTIMIZATI...
Publication number
20240151656
Publication date
May 9, 2024
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
ENDPOINT DETECTION IN LOW OPEN AREA AND/OR HIGH ASPECT RATIO ETCH A...
Publication number
20230268235
Publication date
Aug 24, 2023
Applied Materials, Inc.
Lei LIAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-LEVEL RF PULSE MONITORING AND RF PULSING PARAMETER OPTIMIZATI...
Publication number
20230184693
Publication date
Jun 15, 2023
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
Pulsed Plasma Monitoring Using Optical Sensor
Publication number
20150241272
Publication date
Aug 27, 2015
Lei Lian
G01 - MEASURING TESTING
Information
Patent Application
INFRARED ENDPOINT DETECTION FOR PHOTORESIST STRIP PROCESSES
Publication number
20100190098
Publication date
Jul 29, 2010
Applied Materials, Inc.
QUENTIN E. WALKER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SELF-DIAGNOSTIC SEMICONDUCTOR EQUIPMENT
Publication number
20100076729
Publication date
Mar 25, 2010
Applied Materials, Inc.
MATTHEW F. DAVIS
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING MASS FLOW CONTROLLERS
Publication number
20100071438
Publication date
Mar 25, 2010
Applied Materials, Inc.
Matthew F. Davis
G01 - MEASURING TESTING
Information
Patent Application
Neural Network Methods and Apparatuses for Monitoring Substrate Pro...
Publication number
20070249071
Publication date
Oct 25, 2007
Lei Lian
G01 - MEASURING TESTING
Information
Patent Application
Method for automatic determination of substrates states in plasma p...
Publication number
20060028646
Publication date
Feb 9, 2006
Matthew F. Davis
G01 - MEASURING TESTING