Qun Gao

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Gainesville, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing discrete traps in semiconductor devices
- Patent number 9,691,861
- Issue date Jun 27, 2017
- Mitsubishi Electric Research Laboratories, Inc.
- Andrei Kniazev
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for Analyzing Discrete Traps in Semiconductor Devices
- Publication number 20150192635
- Publication date Jul 9, 2015
- Mitsubishi Electric Research Laboratories, Inc.
- Andrei Kniazev
- G01 - MEASURING TESTING